High speed testing. 

 - New York :   John Wiley and Sons,   [1967] 
 - VIII, 344 p. :   il. ;   25 cm. 
 - Applied polumer symposia ;   5 .
 - Applied polumer symposia ;   5 .
<br/><br/>Contiene: V. VI: The Rhelogy of solids: Sisth Internatational Symposium Held at Boston 1967, Co-Chairmen Rodney D. Andrews, Frederick R. Eirich